Contamination Control - Clean Chemistry
 Successful ultra trace and trace elemental analysis is as dependent on clean chemistry sample handling as it is on the accuracy and precision of the instrumentation used to carry out the analysis. There are potentially many sources of contamination during an analysis e.g. reagent purity, method of sample preparation including equipment and environment, cross contamination of samples. Implementing good practice in this key area has direct impact on data quality. For example, any level of contaminants present in the blank impacts directly on the accuracy of the sample measurements. The inability to control the analytical blank is the primary source of error and the limiting factor for ultra-trace analysis.
There are a number of external factors that can critically impact the quality of your data. The following factors are well within the control of the modern chemist:
Each of these factors, in one way or another, is related to the analytical blank: its chemical composition, its measurement, and its effective control.
Agilent Technologies Semiconductor Laboratory Startup & Contamination Control Guide
This 8-page guide is full of hints and tips for anyone involved in the analysis of ultra and trace metals in semiconductor related matrices by ICP-MS. Written by one of Agilent’s Application Engineers with many year’s experience in this field, the guide contains sections on Sample Preparation Environment, Deionized Water, High Purity Chemicals, Contamination Control during sample handling, Instrument Calibration Standards, Lab-Ware Cleaning Procedures, and more.
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