Semiconductor Analysis Solutions 

Semiconductor Analysis

If you measure impurities in chemicals used in semiconductor fabrication, or test for contaminants on silicon wafers or final components, Agilent Technologies can deliver the most sensitive, reliable and robust analytical methods to meet your requirements.  Agilent analytical instruments offer the highest performance for trace element analysis across the range of samples in the semiconductor industry, including silicon wafers by surface metal extraction (SME), solar PV silicon, high purity process chemicals, ultrapure water, organic solvents and photoresists.  In addition, Agilent Technologies provides world-class applications and service support to ensure you maintain the highest levels of productivity.

Subscribe to the highly acclaimed ICP-MS journal

Agilent 7700s ICP-MS

High Performance for High Purity Semiconductor Applications

The 7700s ICP-MS is configured for ultra-trace elemental analysis of high purity materials used in the semiconductor industry. With unmatched cool plasma capability, the 7700s also delivers industry-leading performance for the measurement of easily ionized elements in high-purity materials, allowing all common semiconductor analytical methods to be performed on the same instrument.

Please select your country:
 
   
Registration   |  Login Benefits of Registration