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Specifications Agilent 1200 Series Multiple Wavelength Detector |
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Detector type |
1024-element diode array |
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Light source |
Deuterium and tungsten lamp |
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Number of signals |
8 |
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Maximum sampling rate |
20 Hz |
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Short-term noise |
± 0.8 x 10 -5 AU at 254 nm and at 750 nm |
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Drift |
0.9 x 10 -3 mAU/h at 254 nm |
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Linearity |
>2 AU upper limit |
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Wavelength range |
190-950 nm |
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Wavelength accuracy |
± 1 nm, self-calibration with deuterium lines, verification with holmium oxide filter |
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Slit width |
Programmable: 1, 2, 4, 8, 16 nm |
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Diode width |
< 1 nm |
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Wavelength bunching |
Programmable, 2 - 400 nm, in steps of 1 nm |
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Flow cells |
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Standard |
13-µL volume, 10 mm-cell path length, 120 bar (1760 psi) pressure maximum |
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Semi-micro |
5-µL volume, 6-mm cell path length, 120 bar (1760 psi) pressure maximum |
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Micro |
2-µL, volume, 3-mm cell path length, 400 bar (5880 psi) pressure maximum |
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Semi-nano |
500-nanoliter volume., 10-mm cell path length, 50 bar (735 psi) pressure maximum |
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Nano |
80-nanoliter volume, 6-mm cell path length, 50 bar (735 psi) pressure maximum |
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High pressure |
1.7-µL volume, 6-mm cell path length, 400 bar (5880 psi) pressure maximum |
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Preparative |
3-mm cell path length, 120 bar (1760 psi) pressur maximum
0.3-mm cell path lenght, 20 bar (294 psi) pressure maximum, quartz
0.06-mm cell path length, 20 bar (294 psi) pressure maximum, quartz |
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Time programmable |
Wavelength, polarity, peak width, lamp bandwidth, autobalance, wavelength range, threshold, spectra storage mode |
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Analog output |
Recorder/integrator 100 mV or 1 V, 2 outputs |
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GLP features |
Electronic records of maintenance and errors. Early maintenance feedback (EMF) for continuous tracking of instrument usage, display of feedback messages if preset limits are exceeded. Verification of wavelength accuracy with built-in holmium oxide filter. | |
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