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Switching to ICP-MS from GFAAS or ICP-OES 

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Switching to ICP-MS from GFAAS or ICP-OES

ICP-MS (inductively coupled plasma mass spectrometry), ICP-OES (inductively coupled plasma optical emission spectrometry), and GFAAS (graphite furnace atomic absorption spectroscopy) are all elemental analytical techniques used for the measurement of trace and minor components in liquid samples or solid samples after acid digestion.

Historically, the sensitivity and multielement capability of ICP-MS has caused it to be seen as a natural replacement for GFAAS, which is a single element (therefore, slow) technique for trace element analysis. However, as the robustness, matrix tolerance and linear range of ICP-MS has improved, it has become accepted that ICP-MS can replace ICP-OES for many applications. Agilent’s 7700 Series goes further, adding unique new capabilities to ICP-MS – such as a nine-order linear working range, ultratrace measurement of mercury, lower detection limits, and the removal of matrix-based spectral interferences allowing ultratrace detection in the most complex sample types. Now, with the 7700 Series, you can handle all of your trace metals analysis requirements with a single instrument.

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