View recent articles featuring Agilent ICP-MS that have appeared in various publications. All articles are copyright of the respective owners and appear with permission.
- ICP-MS Analysis of Trace Selenium in the Great Salt Lake (pdf, 173 kbytes)
William O. Moellmer, Theron G. Miller, Utah Division of Water Quality, and Steve Wilbur, Emmett Soffey, Agilent Technologies, Inc.
The study shows how only the 7500ce ORS is suitable for the analysis of selenium analysis in Great Salt Lake water samples compared to other ICP-MS instrumentation. Utah Division of Water Quality has recommended that EPA begin the process of certifying ORS ICP-MS as an available method for selenium analysis in hypersaline samples.
Spectroscopy, January 1, 2007
- The Use of Collision/Reaction Cell ICP-MS for the Determination of Elements in Blood and Serum Samples
R. Wahlen, L. Evans, J. Turner, R. Hearn, LGC Teddington, UK
This study describes the development of a robust, high-throughput analytical method for the determination of 18 elements in blood and serum samples using a collision/reaction cell ICP-MS.
Spectroscopy, Dec 1, 2005
- Application of Laser Ablation ICP-MS to the Analysis of Forensic Glass Samples
Lawrence Neufeld, New Wave, USA
Laser ablation ICP-MS enables identification and comparison of physical crime-scene evidence. Discriminating elemental and isotopic differences of solid samples directly at the parts-per-billion level provides forensic scientists with a powerful analytical tool.
Spectroscopy, July 1, 2005
- Applications of ICP-MS in Homeland Security (pdf)
Steven Wilbur, Agilent Technologies Inc., USA
Discusses the advantages of ICP-MS compared to other techniques as a rapid screening tool for the presence of toxic compounds of elements in the environment.
American Lab News Edition Vol.36, No. 19, September 2004
- Performing ICP-MS Characterization of High-purity Chemicals in Fab Delivery Systems
Robert M. Woods, T. Paul Adl, and Terrence C. Leslie, Micron Technology, Manassas, VA
Trace-level contamination data is presented from unfiltered and filtered high-purity chemicals used in the high-use delivery system at one of the company’s fabs.
Micro Magazine, April 2004
- ICP-MS: It’s Elemental (Product Review, pdf)
Katie Cottingham, Analytical Chemistry & Journal of Proteome Research, American Chemical Society, 1155 16th Street, NW, Washington, DC 20036, USA
Up to date review of ICP-MS products and market trends.
Analytical Chemistry January 1, 2004 p. 36-38
- Assessment of VPD/ICP-MS for Routine Contamination Monitoring in a High-Volume Production Fab
Luke Lovejoy and Steven Hues, Motorola, USA
This paper describes VPD/ICP-MS for the analysis of impurities on the surface of silicon wafers, instituted in Motorola’s Digital DNA Laboratories, which has the advantages of both high sensitivity and full wafer analysis. Extremely low levels of impurity atoms on a wafer surface may produce significant reductions in both the yield and reliability of semiconductor devices. It is critical, therefore, that the entire semiconductor manufacturing process be monitored for the presence of potential contaminants.
This article first appeared in Future Fab International, Issue 13, July 2002, published by Technology Publishing a division of Montgomery Research Europe Limited, London England.
- ICP-MS Helps Drinking Water Lab Ramp Up Analytical Throughput
Tim Down, STL, Bridgend Science Park, Bridgend, UK
This article describes how STL organize their laboratory in “factory mode” to maximize sample throughput while maintaining the highest analytical standards. ICP-MS has played an integral part in allowing STL to meet streamline its approach to metals analysis of drinking water. More traditional techniques e.g. GFAAS, ICP-OES, hydride generation/atomic fluorescence detection have all been replaced by two Agilent systems.
International Environmental Technology Articles, Vol 12 Issue 5 September/October 2002
- Meeting UK Drinking Water Inspectorate Requirements for Trace Metals Analysis with ICP-MS
Ed McCurdy, Glenn Woods and Don Potter, Agilent Technologies, Lakeside, Cheadle Royal Business Park, Stockport, UK
The article demonstrates how the Agilent ICP-MS can be used for the measurement of high concentration elements such as Na and Ca, while the wide dynamic range of the instrument allowed detection limit criteria for trace elements, such as Hg, to be met simultaneously.
International Environmental Technology (IET) 10/4 2000 p.2-4
- A Comparison of GC–ICP-MS and HPLC–ICP-MS for the Analysis of Organotin Compounds
Raimund Wahlen, LGC (Teddington) Ltd, Queen’s Road, Teddington, Middlesex, UK
The paper shows that both HPLC–ICP-MS and GC–ICP-MS offer advantages for organotin speciation analysis. Whilst there is no statistical difference in the results obtained, HPLC–ICP-MS can be used for cheaper and faster determinations of large sample batches, whilst the superior sensitivity and the greater number of analytes separated make GC–ICP-MS an ideal tool for monitoring studies at the ultra-trace level.
LC-GC Europe October, 2002, pp. 2-6
- Speciation Analysis of Organotin Compounds by HPLC-ICP-MS
Ben Fairman and Raimund Wahlen, LGC (Teddington) Ltd, Queen’s Road, Teddington, Middlesex, UK
Toxicity of trace metals depends on the molecular species to which they are chemically bound. As the importance of monitoring elemental species rather than total concentration is realized, LGC are participating in a collaborative programme to produce certified speciation standards and develop validated methods, such as HPLC-ICP-MS, using these standards.
Spectroscopy Europe 13/5 2001 p.16-22
- Optimizing ICP-MS for the Determination of Trace Metals in High Matrix Samples (pdf)
Ed McCurdy and Don Potter, Agilent Technologies, Lakeside, Cheadle Royal Business Park, Stockport, UK
The article discusses ICP-MS design for optimum performance with high matrix samples. The principles and technology described in this article have been employed in the development of all Agilent’s ICP-MS products.
Spectroscopy Europe 13/3 2001 p.10-13
- Zonation Studies in Garnet
LA-ICP-MS Application note courtesy of New Wave Research
The high quality LA-ICP-MS data outlined in this application note was obtained at the University of Wuerzburg, Germany using a Merchantek laser ablation system coupled to an Agilent 7500i ICP-MS. Electron Microprobe and LA-ICP-MS comparative data shows good agreement, although the reproducibility of the LA-ICP-MS data is superior at lower levels. Inclusions present in the garnet can be clearly seen from the spatially resolved analysis spectra.
New Wave Research Application Note AG-0801
- Performance Testing of ICP-MS for the Routine Monitoring of Trace Metal Contamination
Iain Harrison and Frazer Tollan, EKC Technology, Scotland, UK
EKC Technology, a supplier of high purity reagents to the semiconductor industry, carried out a thorough assessment of ICP-MS according to their own testing evaluation protocol. The article outlines the protocol and discusses the analytical performance of the Agilent 4500 for this specific application.
European Semiconductor January 2001, p.31-34
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