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Thermal Separation Probe 

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Thermal Separation Probe 
A fast and easy alternative for analyzing solid, liquid, slurry samples 
The Agilent Thermal Separation Probe (TSP) makes quick analysis of solid, liquid, and slurry samples. The process is simple and clean, with limited or even no sample preparation, because non-vaporized high boiling point ‘dirty sample matrix’– compounds which can contaminate the GC liner and column – remain inside the micro-vial, and can be discarded after each injection. TSP can be used for complex samples in food testing, forensics, and environmental applications.
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Features
  • Little or no sample prep required
  • Greater flexibility with less risk than traditional direct sample probes 
  • Multi-mode capability allows you to choose between: split, splitless or MMI modes
  • Low risk of contamination or decrease in performance usually associated with traditional direct sample probes
  • Two ways to use TSP with GC/MS system: complex samples can be separated by using a longer analytical column; the neat sample is transferred to the MS via a short deactivated capillary column.
  • Sample delivery is controlled by adjusting split flow ratios, eliminating the possibility of overload or contamination of the detector. 
  • Temperature programming in both the inlet and GC column improves identification of multi-component samples; something traditional direct sample probes are unable to accomplish.
  • Integrates with Agilent GC/MS systems and compatible with the Agilent 5975T GC/MS system, the Agilent 7890A GC with 5975C Series GC/MSD, 7000 Series Triple Quadrupole GC/MS, and the 220 & 240 Ion Trap GC/MS
  • The Agilent Thermal Separation Probe was developed by Professor Aviv Amirav and Dr. Shai Dagan, Tel Aviv University. For more information on Professor Amirav’s research, please visit http://www.tau.ac.il/chemistry/amirav/dsi.shtml

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