Meet the Team 

Over the years, Agilent Technologies has accrued a vast amount of experience and knowledge in serving the semiconductor industry with technologically advanced products, expert applications, and service support. To benefit our customers further, our international team of applications and industry specialists meet regularly to share their applications and technical knowledge relating to the needs of semiconductor manufacturers and suppliers.

	Katsuo Mizobuchi graduated in 1984 with a B.Sc. in Applied Chemistry from Keio University, Japan, where he continued his studies to gain an M.Sc. in Applied Chemistry. In 1986, he joined Yokogawa Electric Corporation, Japan as a research scientist. Whilst working on projects relating to optical devices and ceramic superconducting materials, Katsuo gained experience of semiconductor process and analysis instrumentation such as EPMA (Electron probe micoroanalyzer), SEM, ICP-OES and ICP-MS. On joining Yokogawa Analytical Systems (YAN) in 1993, Katsuo worked as an ICP-MS technical support engineer for 3 years. Since then he has worked as an ICP-MS applications engineer focusing on semiconductor applications support in the Asia/Pacific region.
	Dr. Junichi Takahashi was awarded his Ph.D. in analytical chemistry from The University of Tokyo under the supervision of Professor (emeritus) Keiichiro Fuwa in 1981. He then he joined a Japanese analytical instruments company as a Research and Development scientist during which time he developed a method to couple ETV to ICP-AES for the analysis of thorium and uranium in semiconductor materials. This became a highly successful approach for trace, multi-element analysis prior to the advent of ICP-MS. From 1988 to 1990, Dr Takahashi collaborated with Professor Robert G. Michel at the University of Connecticut, USA, to characterize novel instrumentation for trace metal analysis. In 1997, he joined Yokogawa Analytical Systems, Inc. Japan, to develop application methodology for the analysis of high purity chemicals using ICP-MS. Since that time, Dr. Takahashi-san has consulted with leading semiconductor manufacturers and suppliers worldwide on analytical methodology. He is currently employed as the Semiconductor Industry Marketing Specialist for Agilent Technologies Chemical Analysis Group.
	Dr. Christopher Tye received his first degree with Joint Honors in Chemistry and Zoology from Durham University (UK) in 1978 before moving to the University of Manchester (UK) where he was awarded an M.Sc. in Analytical Chemistry (1979) and Ph.D. (1981). After postdoctoral positions at Plymouth Polytechnic (now University of Plymouth) and Department of Instrumentation and Analytical Science at University of Manchester Institute of Science and Technology (UMIST UK), he joined VG as a Project Scientist working with the newly formed ICP-MS group in 1986. As well as providing application support and troubleshooting, he was also responsible for various successful commercial projects at VG including the world’s first commercial laser ablation system. In 1995, Chris left VG (then owned by Fisons Instruments) to set up his own consulting company where he worked closely with several companies on ICP-MS, ESCA and SIMS projects for semiconductor clients. He moved to Singapore after joining Agilent in 1997. He has been responsible for setting up the successful ICP-MS business throughout Asia Pacific and works closely with semiconductor and related industries in Singapore, Taiwan and Korea.
	Ed McCurdy received his B.Sc. in Marine and Fish Biology from the University of Plymouth, UK in 1983. Prior to joining Agilent Technologies in 1997, he was a research assistant in Dr. Alan Gray's ICP-MS Laboratory at Surrey University, working with early ICP-MS systems in the 1980s. Since joining Agilent as an ICP-MS Specialist for Europe, he has supported semiconductor companies using Agilent ICP-MS systems in applications including wafer fabrication, pure water and acid production, manufacture of organic resist strippers and post-etch cleaners, and research into novel materials. In addition, he has helped develop ICP-MS methods for the analysis of high-purity metal solutions and organic solvents by ICP-MS.
	Bert Woods received his B.S. in Chemistry from Radford University in 1997. Prior to joining Agilent Technologies in 2004, he was an analytical chemist and trace-metals specialist for Dominion Semiconductor (IBM/Toshiba)/Micron Technology in Manassas, Virginia. While at Dominion Semiconductor/Micron he oversaw all ICP-MS, ICP-OES, and GFAA applications and methodology. In his role as an Agilent applications specialist for the semiconductor industry in North America (based in Delaware), Bert supports applications ranging from high-purity chemicals and waters, resists, and wafer analysis.